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1 Ergebnisse
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Impact of Negative-Bias-Temperature-Instability on Channel ..:
Huang, Chen-Shuo
;
Liu, Po-Tsun
Electrochemical and Solid-State Letters. 14 (2011) 5 - p. H194 , 2011
Link:
https://doi.org/10.1149/1.3551463
RT Journal T1 <Title>Impact of Negative-Bias-Temperature-Instability on Channel Bulk of Polysilicon TFT by Gated PIN Diode Analysis</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1149_1.3551463&Exemplar=1&LAN=DE A1 Huang, Chen-Shuo A1 Liu, Po-Tsun PB The Electrochemical Society YR 2011 SN 1099-0062 JF Electrochemical and Solid-State Letters VO 14 IS 5 SP H194 LK http://dx.doi.org/https://doi.org/10.1149/1.3551463 DO https://doi.org/10.1149/1.3551463 SF ELIB - SuUB Bremen
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