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1 Ergebnisse
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Comparison of Nonvolatile Memory Effects in Ni-Based Layere..:
Lee, Jun-Young
;
Kim, Jeong-Eun
;
Hwang, Jin-Ha
...
Electrochemical and Solid-State Letters. 14 (2011) 7 - p. J41 , 2011
Link:
https://doi.org/10.1149/1.3583534
RT Journal T1 <Title>Comparison of Nonvolatile Memory Effects in Ni-Based Layered and Dotted Nanostructures Prepared through Atomic Layer Deposition</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1149_1.3583534&Exemplar=1&LAN=DE A1 Lee, Jun-Young A1 Kim, Jeong-Eun A1 Hwang, Jin-Ha A1 Ahn, Jae-Pyoung A1 Lee, Byung Kook A1 Kim, Seok-Hwan A1 Chung, Taek-Mo A1 Lee, Sun Sook A1 Kim, Chang Gyoun A1 An, Ki-Seok PB The Electrochemical Society YR 2011 SN 1099-0062 JF Electrochemical and Solid-State Letters VO 14 IS 7 SP J41 LK http://dx.doi.org/https://doi.org/10.1149/1.3583534 DO https://doi.org/10.1149/1.3583534 SF ELIB - SuUB Bremen
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