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1 Ergebnisse
1
(Invited)Bulk Traps in Layered 2D Gate Dielectrics:
Shin, Jaemin
;
Pathan, Tyafur
;
Zhou, Guanyu
.
ECS Transactions. 113 (2024) 2 - p. 25-33 , 2024
Link:
https://doi.org/10.1149/11302.0025ecst
RT Journal T1
(Invited)Bulk Traps in Layered 2D Gate Dielectrics
UL https://suche.suub.uni-bremen.de/peid=cr-10.1149_11302.0025ecst&Exemplar=1&LAN=DE A1 Shin, Jaemin A1 Pathan, Tyafur A1 Zhou, Guanyu A1 Hinkle, Christopher L. PB The Electrochemical Society YR 2024 SN 1938-5862 SN 1938-6737 JF ECS Transactions VO 113 IS 2 SP 25 OP 33 LK http://dx.doi.org/https://doi.org/10.1149/11302.0025ecst DO https://doi.org/10.1149/11302.0025ecst SF ELIB - SuUB Bremen
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