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1 Ergebnisse
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Accelerated Degradation of SiO/NCM Cell Quick Rechargeabili..:
Kim, Tae Hyeon
;
Park, Sung Su
;
Kang, Min Su
...
Journal of The Electrochemical Society. 169 (2022) 2 - p. 020562 , 2022
Link:
https://doi.org/10.1149/1945-7111/ac53cf
RT Journal T1 <Title>Accelerated Degradation of SiO/NCM Cell Quick Rechargeability Due to Depth-of-Discharge Range Dependent Failure Induced Li Dendrite Formation</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1149_1945-7111_ac53cf&Exemplar=1&LAN=DE A1 Kim, Tae Hyeon A1 Park, Sung Su A1 Kang, Min Su A1 Kim, Ye Rin A1 Park, Ho Seok A1 Kim, Hyun-seung A1 Jeong, Goojin PB The Electrochemical Society YR 2022 SN 0013-4651 SN 1945-7111 JF Journal of The Electrochemical Society VO 169 IS 2 SP 020562 LK http://dx.doi.org/https://doi.org/10.1149/1945-7111/ac53cf DO https://doi.org/10.1149/1945-7111/ac53cf SF ELIB - SuUB Bremen
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