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In Situ Measurement of Dynamic Internal Short Circuit Resis..:
Liu, Siyi
;
Huang, Shan
;
Zhou, Qian
...
Journal of The Electrochemical Society. 170 (2023) 6 - p. 060515 , 2023
Link:
https://doi.org/10.1149/1945-7111/acd814
RT Journal T1 <Title>In Situ Measurement of Dynamic Internal Short Circuit Resistance during Nail Penetration of Lithium-Ion Cells and its Implications on Cell Robustness and Abuse Tolerance</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1149_1945-7111_acd814&Exemplar=1&LAN=DE A1 Liu, Siyi A1 Huang, Shan A1 Zhou, Qian A1 Snyder, Kent A1 Long, Mary K. A1 Zhang, Guangsheng PB The Electrochemical Society YR 2023 SN 0013-4651 SN 1945-7111 JF Journal of The Electrochemical Society VO 170 IS 6 SP 060515 LK http://dx.doi.org/https://doi.org/10.1149/1945-7111/acd814 DO https://doi.org/10.1149/1945-7111/acd814 SF ELIB - SuUB Bremen
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