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Beyond the Limit of Ideal Nernst Sensitivity: Ultra-High Se..:
Chen, Yi-Ting
;
Hseih, Ching-Yen
;
Sarangadharan, Indu
...
ECS Journal of Solid State Science and Technology. 7 (2018) 9 - p. Q176-Q183 , 2018
Link:
https://doi.org/10.1149/2.0011810jss
RT Journal T1 <Title>Beyond the Limit of Ideal Nernst Sensitivity: Ultra-High Sensitivity of Heavy Metal Ion Detection with Ion-Selective High Electron Mobility Transistors</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1149_2.0011810jss&Exemplar=1&LAN=DE A1 Chen, Yi-Ting A1 Hseih, Ching-Yen A1 Sarangadharan, Indu A1 Sukesan, Revathi A1 Lee, Geng-Yen A1 Chyi, Jen-Inn A1 Wang, Yu-Lin PB The Electrochemical Society YR 2018 SN 2162-8769 SN 2162-8777 JF ECS Journal of Solid State Science and Technology VO 7 IS 9 SP Q176 OP Q183 LK http://dx.doi.org/https://doi.org/10.1149/2.0011810jss DO https://doi.org/10.1149/2.0011810jss SF ELIB - SuUB Bremen
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