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1 Ergebnisse
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Hafnium Impurity Defects in Silicon: A Characterization:
Mica, I.
;
Frascaroli, J.
;
Vangelista, S.
...
ECS Journal of Solid State Science and Technology. 7 (2018) 10 - p. P583-P587 , 2018
Link:
https://doi.org/10.1149/2.0011811jss
RT Journal T1 <Title>Hafnium Impurity Defects in Silicon: A Characterization</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1149_2.0011811jss&Exemplar=1&LAN=DE A1 Mica, I. A1 Frascaroli, J. A1 Vangelista, S. A1 Caniatti, M. A1 Piagge, R. A1 Toia, F. F. R. A1 Juhel, M. A1 Polignano, M. L. PB The Electrochemical Society YR 2018 SN 2162-8769 SN 2162-8777 JF ECS Journal of Solid State Science and Technology VO 7 IS 10 SP P583 OP P587 LK http://dx.doi.org/https://doi.org/10.1149/2.0011811jss DO https://doi.org/10.1149/2.0011811jss SF ELIB - SuUB Bremen
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