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An Investigation of the Different Charge Trapping Mechanism..:
Wook Lee, Young
;
Kim, Sun-Jae
;
Lee, Soo-Yeon
...
Electrochemical and Solid-State Letters. 15 (2012) 4 - p. H84 , 2012
Link:
https://doi.org/10.1149/2.003204esl
RT Journal T1 <Title>An Investigation of the Different Charge Trapping Mechanisms for SiNx and SiO2 Gate Insulator in a-IGZO TFTs</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1149_2.003204esl&Exemplar=1&LAN=DE A1 Wook Lee, Young A1 Kim, Sun-Jae A1 Lee, Soo-Yeon A1 Lee, Woo-Geun A1 Yoon, Kap-Soo A1 Park, Jae-Woo A1 Han, Min-Koo PB The Electrochemical Society YR 2012 SN 1099-0062 JF Electrochemical and Solid-State Letters VO 15 IS 4 SP H84 LK http://dx.doi.org/https://doi.org/10.1149/2.003204esl DO https://doi.org/10.1149/2.003204esl SF ELIB - SuUB Bremen
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