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Determination of Majority Carrier Capture Rates via Deep Le..:
Lauwaert, J.
;
Khelifi, S.
;
Vrielinck, H.
ECS Journal of Solid State Science and Technology. 5 (2015) 4 - p. P3041-P3047 , 2015
Link:
https://doi.org/10.1149/2.0071604jss
RT Journal T1 <Title>Determination of Majority Carrier Capture Rates via Deep Level Transient Spectroscopy</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1149_2.0071604jss&Exemplar=1&LAN=DE A1 Lauwaert, J. A1 Khelifi, S. A1 Vrielinck, H. PB The Electrochemical Society YR 2015 SN 2162-8769 SN 2162-8777 JF ECS Journal of Solid State Science and Technology VO 5 IS 4 SP P3041 OP P3047 LK http://dx.doi.org/https://doi.org/10.1149/2.0071604jss DO https://doi.org/10.1149/2.0071604jss SF ELIB - SuUB Bremen
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