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Defects and Dopants in Silicon Nanowires Produced by Metal-..:
Fanciulli, M.
;
Belli, M.
;
Paleari, S.
...
ECS Journal of Solid State Science and Technology. 5 (2016) 4 - p. P3138-P3141 , 2016
Link:
https://doi.org/10.1149/2.0171604jss
RT Journal T1 <Title>Defects and Dopants in Silicon Nanowires Produced by Metal-Assisted Chemical Etching</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1149_2.0171604jss&Exemplar=1&LAN=DE A1 Fanciulli, M. A1 Belli, M. A1 Paleari, S. A1 Lamperti, A. A1 Sironi, M. A1 Pizio, A. PB The Electrochemical Society YR 2016 SN 2162-8769 SN 2162-8777 JF ECS Journal of Solid State Science and Technology VO 5 IS 4 SP P3138 OP P3141 LK http://dx.doi.org/https://doi.org/10.1149/2.0171604jss DO https://doi.org/10.1149/2.0171604jss SF ELIB - SuUB Bremen
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