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Evolution of Microstructural Disorder in Annealed Bismuth T..:
Erickson, Kristopher J.
;
Limmer, Steven J.
;
Yelton, W. Graham
...
ECS Journal of Solid State Science and Technology. 6 (2017) 3 - p. N3117-N3124 , 2017
Link:
https://doi.org/10.1149/2.0181703jss
RT Journal T1 <Title>Evolution of Microstructural Disorder in Annealed Bismuth Telluride Nanowires</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1149_2.0181703jss&Exemplar=1&LAN=DE A1 Erickson, Kristopher J. A1 Limmer, Steven J. A1 Yelton, W. Graham A1 Rochford, Caitlin A1 Siegal, Michael P. A1 Medlin, Douglas L. PB The Electrochemical Society YR 2017 SN 2162-8769 SN 2162-8777 JF ECS Journal of Solid State Science and Technology VO 6 IS 3 SP N3117 OP N3124 LK http://dx.doi.org/https://doi.org/10.1149/2.0181703jss DO https://doi.org/10.1149/2.0181703jss SF ELIB - SuUB Bremen
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