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1 Ergebnisse
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Evaluation of Sn-Doped Indium Oxide Film and Interface Prop..:
Nishihara, T.
;
Kamioka, T.
;
Kanai, H.
...
ECS Journal of Solid State Science and Technology. 8 (2019) 6 - p. Q101-Q105 , 2019
Link:
https://doi.org/10.1149/2.0181906jss
RT Journal T1 <Title>Evaluation of Sn-Doped Indium Oxide Film and Interface Properties on a-Si Formed by Reactive Plasma Deposition</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1149_2.0181906jss&Exemplar=1&LAN=DE A1 Nishihara, T. A1 Kamioka, T. A1 Kanai, H. A1 Ohshita, Y. A1 Yasuno, S. A1 Hirosawa, I. A1 Ogura, A. PB The Electrochemical Society YR 2019 SN 2162-8769 SN 2162-8777 JF ECS Journal of Solid State Science and Technology VO 8 IS 6 SP Q101 OP Q105 LK http://dx.doi.org/https://doi.org/10.1149/2.0181906jss DO https://doi.org/10.1149/2.0181906jss SF ELIB - SuUB Bremen
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