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Deep Traps in AlGaN/GaN High Electron Mobility Transistors ..:

Polyakov, A. Y. ; Smirnov, N. B. ; Dorofeev, A. A....
ECS Journal of Solid State Science and Technology.  5 (2016)  10 - p. Q260-Q265 , 2016
Link: https://doi.org/10.1149/2.0191610jss