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Linearity Distortion Assessment and Small-Signal Behavior o..:
Srivastava, Nilesh Anand
;
Mishra, Ram Awadh
ECS Journal of Solid State Science and Technology. 8 (2019) 12 - p. N234-N244 , 2019
Link:
https://doi.org/10.1149/2.0201912jss
RT Journal T1 <Title>Linearity Distortion Assessment and Small-Signal Behavior of Nano-Scaled SOI MOSFET for Terahertz Applications</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1149_2.0201912jss&Exemplar=1&LAN=DE A1 Srivastava, Nilesh Anand A1 Mishra, Ram Awadh PB The Electrochemical Society YR 2019 SN 2162-8769 SN 2162-8777 JF ECS Journal of Solid State Science and Technology VO 8 IS 12 SP N234 OP N244 LK http://dx.doi.org/https://doi.org/10.1149/2.0201912jss DO https://doi.org/10.1149/2.0201912jss SF ELIB - SuUB Bremen
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