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1 Ergebnisse
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The Influence of the Bitline Length on the Resistance Consi..:
Lu, Yao-Yao
;
Cai, Dao-Lin
;
Chen, Yi-Feng
...
ECS Journal of Solid State Science and Technology. 7 (2018) 3 - p. Q33-Q37 , 2018
Link:
https://doi.org/10.1149/2.0211803jss
RT Journal T1 <Title>The Influence of the Bitline Length on the Resistance Consistency in Phase Change Memory Array</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1149_2.0211803jss&Exemplar=1&LAN=DE A1 Lu, Yao-Yao A1 Cai, Dao-Lin A1 Chen, Yi-Feng A1 Lei, Yu A1 Yan, Shuai A1 Wu, Lei A1 Liu, Yuan-Guang A1 Li, Yang A1 Song, Zhi-Tang PB The Electrochemical Society YR 2018 SN 2162-8769 SN 2162-8777 JF ECS Journal of Solid State Science and Technology VO 7 IS 3 SP Q33 OP Q37 LK http://dx.doi.org/https://doi.org/10.1149/2.0211803jss DO https://doi.org/10.1149/2.0211803jss SF ELIB - SuUB Bremen
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