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1 Ergebnisse
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Review—Defect Identification with Positron Annihilation Spe..:
Slotte, J.
;
Makkonen, I.
;
Tuomisto, F.
ECS Journal of Solid State Science and Technology. 5 (2016) 4 - p. P3166-P3171 , 2016
Link:
https://doi.org/10.1149/2.0231604jss
RT Journal T1 <Title>Review—Defect Identification with Positron Annihilation Spectroscopy in Narrow Band Gap Semiconductors</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1149_2.0231604jss&Exemplar=1&LAN=DE A1 Slotte, J. A1 Makkonen, I. A1 Tuomisto, F. PB The Electrochemical Society YR 2016 SN 2162-8769 SN 2162-8777 JF ECS Journal of Solid State Science and Technology VO 5 IS 4 SP P3166 OP P3171 LK http://dx.doi.org/https://doi.org/10.1149/2.0231604jss DO https://doi.org/10.1149/2.0231604jss SF ELIB - SuUB Bremen
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