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1 Ergebnisse
1
Anomalous Gate Current Hump after Dynamic Negative Bias Str..:
Ho, Szu-Han
;
Chang, Ting-Chang
;
Wu, Chi-Wei
...
ECS Journal of Solid State Science and Technology. 2 (2013) 9 - p. Q187-Q191 , 2013
Link:
https://doi.org/10.1149/2.027309jss
RT Journal T1
Anomalous Gate Current Hump after Dynamic Negative Bias Stress and Negative-Bias Temperature-Instability in p-MOSFETs with HfxZr1−xO2and HfO2/Metal Gate Stacks
UL https://suche.suub.uni-bremen.de/peid=cr-10.1149_2.027309jss&Exemplar=1&LAN=DE A1 Ho, Szu-Han A1 Chang, Ting-Chang A1 Wu, Chi-Wei A1 Lo, Wen-Hung A1 Chen, Ching-En A1 Tsai, Jyun-Yu A1 Chen, Hua-Mao A1 Liu, Guan-Ru A1 Tseng, Tseung-Yuen A1 Cheng, Osbert A1 Huang, Cheng-Tung A1 Chen, Daniel A1 Sze, Simon M. PB The Electrochemical Society YR 2013 SN 2162-8769 SN 2162-8777 JF ECS Journal of Solid State Science and Technology VO 2 IS 9 SP Q187 OP Q191 LK http://dx.doi.org/https://doi.org/10.1149/2.027309jss DO https://doi.org/10.1149/2.027309jss SF ELIB - SuUB Bremen
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