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Review—Recent Advancement in Charge- and Photo-Assisted Non..:
Wilson, Marshall
;
Findlay, Andrew
;
Savtchouk, Alexandre
...
ECS Journal of Solid State Science and Technology. 6 (2017) 11 - p. S3129-S3140 , 2017
Link:
https://doi.org/10.1149/2.0291711jss
RT Journal T1 <Title>Review—Recent Advancement in Charge- and Photo-Assisted Non-Contact Electrical Characterization of SiC, GaN, and AlGaN/GaN HEMT</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1149_2.0291711jss&Exemplar=1&LAN=DE A1 Wilson, Marshall A1 Findlay, Andrew A1 Savtchouk, Alexandre A1 D'Amico, John A1 Hillard, Robert A1 Horikiri, Fumimasa A1 Lagowski, Jacek PB The Electrochemical Society YR 2017 SN 2162-8769 SN 2162-8777 JF ECS Journal of Solid State Science and Technology VO 6 IS 11 SP S3129 OP S3140 LK http://dx.doi.org/https://doi.org/10.1149/2.0291711jss DO https://doi.org/10.1149/2.0291711jss SF ELIB - SuUB Bremen
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