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1 Ergebnisse
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Effects of Thermal Annealing on the Electronic Structure an..:
Chun, Ji-Yun
;
Han, Jin-Woo
;
Kim, Tae-Wan
.
Electrochemical and Solid-State Letters. 15 (2012) 6 - p. J31 , 2012
Link:
https://doi.org/10.1149/2.030206esl
RT Journal T1 <Title>Effects of Thermal Annealing on the Electronic Structure and Hole-Injection Properties of Molybdenum-Doped Zinc Oxide∕Organic Semiconductor Interfaces</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1149_2.030206esl&Exemplar=1&LAN=DE A1 Chun, Ji-Yun A1 Han, Jin-Woo A1 Kim, Tae-Wan A1 Seo, Dae-Shik PB The Electrochemical Society YR 2012 SN 1099-0062 JF Electrochemical and Solid-State Letters VO 15 IS 6 SP J31 LK http://dx.doi.org/https://doi.org/10.1149/2.030206esl DO https://doi.org/10.1149/2.030206esl SF ELIB - SuUB Bremen
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