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Improvement in the Reliability of AlGaInP-Based Light-Emitt..:
Kim, Ho-Young
;
Lee, Jong Woo
;
Moon, Young Min
...
ECS Journal of Solid State Science and Technology. 9 (2019) 1 - p. 015014 , 2019
Link:
https://doi.org/10.1149/2.0332001jss
RT Journal T1 <Title>Improvement in the Reliability of AlGaInP-Based Light-Emitting Diode Package Using Optimal Silicone and Leadframe Structure</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1149_2.0332001jss&Exemplar=1&LAN=DE A1 Kim, Ho-Young A1 Lee, Jong Woo A1 Moon, Young Min A1 Oh, Jeong Tak A1 Jeong, Hwan-Hee A1 Song, June-O A1 Seong, Tae-Yeon A1 Kneissl, Michael A1 Amano, Hiroshi PB The Electrochemical Society YR 2019 SN 2162-8769 SN 2162-8777 JF ECS Journal of Solid State Science and Technology VO 9 IS 1 SP 015014 LK http://dx.doi.org/https://doi.org/10.1149/2.0332001jss DO https://doi.org/10.1149/2.0332001jss SF ELIB - SuUB Bremen
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