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1 Ergebnisse
1
Improvement in Bias Stress Reliability by Barrier Thickness..:
Kong, Bo Hyun
;
Cho, Hyung Koun
;
Jung, Sung Hoon
...
Journal of The Electrochemical Society. 159 (2011) 2 - p. H157-H161 , 2011
Link:
https://doi.org/10.1149/2.059202jes
RT Journal T1 <Title>Improvement in Bias Stress Reliability by Barrier Thickness Variation in GaN Based Light-Emitting Diodes</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1149_2.059202jes&Exemplar=1&LAN=DE A1 Kong, Bo Hyun A1 Cho, Hyung Koun A1 Jung, Sung Hoon A1 Jeong, Jong Pil A1 Lee, Seon Ho A1 Lee, Sang Hyun A1 Son, Sung Jin A1 Oh, Myeong Seok PB The Electrochemical Society YR 2011 SN 0013-4651 SN 1945-7111 JF Journal of The Electrochemical Society VO 159 IS 2 SP H157 OP H161 LK http://dx.doi.org/https://doi.org/10.1149/2.059202jes DO https://doi.org/10.1149/2.059202jes SF ELIB - SuUB Bremen
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