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1 Ergebnisse
1
Probing Degradation by IL-TEM: The Influence of Stress Test..:
Zana, Alessandro
;
Speder, Jozsef
;
Roefzaad, Melanie
...
Journal of The Electrochemical Society. 160 (2013) 6 - p. F608-F615 , 2013
Link:
https://doi.org/10.1149/2.078306jes
RT Journal T1 <Title>Probing Degradation by IL-TEM: The Influence of Stress Test Conditions on the Degradation Mechanism</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1149_2.078306jes&Exemplar=1&LAN=DE A1 Zana, Alessandro A1 Speder, Jozsef A1 Roefzaad, Melanie A1 Altmann, Lena A1 Bäumer, Marcus A1 Arenz, Matthias PB The Electrochemical Society YR 2013 SN 0013-4651 SN 1945-7111 JF Journal of The Electrochemical Society VO 160 IS 6 SP F608 OP F615 LK http://dx.doi.org/https://doi.org/10.1149/2.078306jes DO https://doi.org/10.1149/2.078306jes SF ELIB - SuUB Bremen
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