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1 Ergebnisse
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Endurance Improvement of Phase Change Memory Based on High ..:
Wu, Lei
;
Cai, Dao-Lin
;
Chen, Yi-Feng
...
ECS Journal of Solid State Science and Technology. 9 (2020) 3 - p. 035004 , 2020
Link:
https://doi.org/10.1149/2162-8777/ab7883
RT Journal T1 <Title>Endurance Improvement of Phase Change Memory Based on High and Narrow RESET Currents</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1149_2162-8777_ab7883&Exemplar=1&LAN=DE A1 Wu, Lei A1 Cai, Dao-Lin A1 Chen, Yi-Feng A1 Lu, Yao-Yao A1 Liu, Yuan-Guang A1 Zhang, Si-Fan A1 Yan, Shuai A1 Li, Yang A1 Yu, Li A1 Lu, Junjie A1 Song, Zhi-Tang PB The Electrochemical Society YR 2020 SN 2162-8777 JF ECS Journal of Solid State Science and Technology VO 9 IS 3 SP 035004 LK http://dx.doi.org/https://doi.org/10.1149/2162-8777/ab7883 DO https://doi.org/10.1149/2162-8777/ab7883 SF ELIB - SuUB Bremen
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