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A Deep Level Transient Spectroscopy Study of Hole Traps in ..:

Hsu, P.-C. ; Simoen, E. ; Lin, D....
ECS Journal of Solid State Science and Technology.  9 (2020)  4 - p. 044006 , 2020
Link: https://doi.org/10.1149/2162-8777/ab8b70