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Characterization of Mono-Crystalline and Multi-Crystalline ..:
Buchovska, Iryna
;
Lüdge, Anke
;
Lüdge, Wolfgang
.
ECS Journal of Solid State Science and Technology. 9 (2020) 8 - p. 086001 , 2020
Link:
https://doi.org/10.1149/2162-8777/abb418
RT Journal T1 <Title>Characterization of Mono-Crystalline and Multi-Crystalline Silicon by the Extended Lateral Photovoltage Scanning and Scanning Photoluminescence</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1149_2162-8777_abb418&Exemplar=1&LAN=DE A1 Buchovska, Iryna A1 Lüdge, Anke A1 Lüdge, Wolfgang A1 Kiessling, Frank M. PB The Electrochemical Society YR 2020 SN 2162-8777 JF ECS Journal of Solid State Science and Technology VO 9 IS 8 SP 086001 LK http://dx.doi.org/https://doi.org/10.1149/2162-8777/abb418 DO https://doi.org/10.1149/2162-8777/abb418 SF ELIB - SuUB Bremen
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