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1 Ergebnisse
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Analysis of Negative Bias Illumination Stress Induced Effec..:
Agrawal, Khushabu S.
;
Patil, Vilas S.
;
Cho, Eun-Chel
.
ECS Journal of Solid State Science and Technology. 9 (2020) 10 - p. 106005 , 2020
Link:
https://doi.org/10.1149/2162-8777/abc6f0
RT Journal T1 <Title>Analysis of Negative Bias Illumination Stress Induced Effect on LTPS and a-IGZO TFT</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1149_2162-8777_abc6f0&Exemplar=1&LAN=DE A1 Agrawal, Khushabu S. A1 Patil, Vilas S. A1 Cho, Eun-Chel A1 Yi, Junsin PB The Electrochemical Society YR 2020 SN 2162-8769 SN 2162-8777 JF ECS Journal of Solid State Science and Technology VO 9 IS 10 SP 106005 LK http://dx.doi.org/https://doi.org/10.1149/2162-8777/abc6f0 DO https://doi.org/10.1149/2162-8777/abc6f0 SF ELIB - SuUB Bremen
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