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1 Ergebnisse
1
Exploration of Nafion for the Electric-Double-Layer Gating ..:
Mou, Peng-Lin
;
Huang, Wan-Qing
;
Yan, Feng-Jie
..
ECS Journal of Solid State Science and Technology. 10 (2021) 2 - p. 025003 , 2021
Link:
https://doi.org/10.1149/2162-8777/abe172
RT Journal T1 <Title>Exploration of Nafion for the Electric-Double-Layer Gating of Metal-Oxide Thin Film Transistors</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1149_2162-8777_abe172&Exemplar=1&LAN=DE A1 Mou, Peng-Lin A1 Huang, Wan-Qing A1 Yan, Feng-Jie A1 Wan, Xi A1 Shao, Feng PB The Electrochemical Society YR 2021 SN 2162-8769 SN 2162-8777 JF ECS Journal of Solid State Science and Technology VO 10 IS 2 SP 025003 LK http://dx.doi.org/https://doi.org/10.1149/2162-8777/abe172 DO https://doi.org/10.1149/2162-8777/abe172 SF ELIB - SuUB Bremen
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