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Improved Reliability of 278 nm Deep Ultraviolet AlGaN-Based..:
Yum, Woong-Sun
;
Lee, Sang-Youl
;
Lim, Hyun-Soo
...
ECS Journal of Solid State Science and Technology. 10 (2021) 4 - p. 045002 , 2021
Link:
https://doi.org/10.1149/2162-8777/abf0e9
RT Journal T1 <Title>Improved Reliability of 278 nm Deep Ultraviolet AlGaN-Based Flip-Chip Light Emitting Diodes by Using ITO/Al Contact</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1149_2162-8777_abf0e9&Exemplar=1&LAN=DE A1 Yum, Woong-Sun A1 Lee, Sang-Youl A1 Lim, Hyun-Soo A1 Choi, Rak-Jun A1 Oh, Jeong-Tak A1 Jeong, Hwan-Hee A1 Seong, Tae-Yeon PB The Electrochemical Society YR 2021 SN 2162-8769 SN 2162-8777 JF ECS Journal of Solid State Science and Technology VO 10 IS 4 SP 045002 LK http://dx.doi.org/https://doi.org/10.1149/2162-8777/abf0e9 DO https://doi.org/10.1149/2162-8777/abf0e9 SF ELIB - SuUB Bremen
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