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1 Ergebnisse
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Effects of Dielectric Passivation on Device Performance of ..:
Kim, Jaeho
;
Oh, Jaejoon
;
Kim, Jongseob
.
ECS Journal of Solid State Science and Technology. 10 (2021) 5 - p. 055016 , 2021
Link:
https://doi.org/10.1149/2162-8777/ac02a0
RT Journal T1 <Title>Effects of Dielectric Passivation on Device Performance of AlGaN/GaN High-Electron-Mobility Transistors</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1149_2162-8777_ac02a0&Exemplar=1&LAN=DE A1 Kim, Jaeho A1 Oh, Jaejoon A1 Kim, Jongseob A1 Cho, Jaehee PB The Electrochemical Society YR 2021 SN 2162-8769 SN 2162-8777 JF ECS Journal of Solid State Science and Technology VO 10 IS 5 SP 055016 LK http://dx.doi.org/https://doi.org/10.1149/2162-8777/ac02a0 DO https://doi.org/10.1149/2162-8777/ac02a0 SF ELIB - SuUB Bremen
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