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Transient Analysis of Crosstalk Noise Effects in SWCNT Bund..:
Gugulothu, Bhaskar
;
Bhukya, Rajendra Naik
ECS Journal of Solid State Science and Technology. 10 (2021) 10 - p. 101013 , 2021
Link:
https://doi.org/10.1149/2162-8777/ac2e7e
RT Journal T1 <Title>Transient Analysis of Crosstalk Noise Effects in SWCNT Bundle On-Chip Interconnects Using MRTD Technique</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1149_2162-8777_ac2e7e&Exemplar=1&LAN=DE A1 Gugulothu, Bhaskar A1 Bhukya, Rajendra Naik PB The Electrochemical Society YR 2021 SN 2162-8769 SN 2162-8777 JF ECS Journal of Solid State Science and Technology VO 10 IS 10 SP 101013 LK http://dx.doi.org/https://doi.org/10.1149/2162-8777/ac2e7e DO https://doi.org/10.1149/2162-8777/ac2e7e SF ELIB - SuUB Bremen
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