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Characterization of Continuous-Wave Laser Crystallized Sili..:
Nguyen, Thi Thuy
;
Kuroki, Shin-Ichiro
ECS Journal of Solid State Science and Technology. 11 (2022) 5 - p. 055001 , 2022
Link:
https://doi.org/10.1149/2162-8777/ac689b
RT Journal T1 <Title>Characterization of Continuous-Wave Laser Crystallized Silicon Thin Films with Hole-Patterns</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1149_2162-8777_ac689b&Exemplar=1&LAN=DE A1 Nguyen, Thi Thuy A1 Kuroki, Shin-Ichiro PB The Electrochemical Society YR 2022 SN 2162-8769 SN 2162-8777 JF ECS Journal of Solid State Science and Technology VO 11 IS 5 SP 055001 LK http://dx.doi.org/https://doi.org/10.1149/2162-8777/ac689b DO https://doi.org/10.1149/2162-8777/ac689b SF ELIB - SuUB Bremen
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