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1 Ergebnisse
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Investigation of the Reverse Leakage Behavior and Substrate..:
Wang, Yekan
;
Liao, Michael E
;
Huynh, Kenny
...
ECS Journal of Solid State Science and Technology. 11 (2022) 6 - p. 065006 , 2022
Link:
https://doi.org/10.1149/2162-8777/ac7418
RT Journal T1 <Title>Investigation of the Reverse Leakage Behavior and Substrate Defects in Vertical GaN Schottky and PIN Diodes</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1149_2162-8777_ac7418&Exemplar=1&LAN=DE A1 Wang, Yekan A1 Liao, Michael E A1 Huynh, Kenny A1 Olsen, William A1 Gallagher, James C A1 Anderson, Travis J A1 Huang, Xianrong A1 Wojcik, Michael J A1 Goorsky, Mark S PB The Electrochemical Society YR 2022 SN 2162-8769 SN 2162-8777 JF ECS Journal of Solid State Science and Technology VO 11 IS 6 SP 065006 LK http://dx.doi.org/https://doi.org/10.1149/2162-8777/ac7418 DO https://doi.org/10.1149/2162-8777/ac7418 SF ELIB - SuUB Bremen
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