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1 Ergebnisse
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Study on Negative Bias Temperature Instability Induced Degr..:
Yeh, Wen-Kuan
;
Yang, Li-Quan
;
Shen, Cheng-Hao
...
ECS Journal of Solid State Science and Technology. 11 (2022) 6 - p. 065005 , 2022
Link:
https://doi.org/10.1149/2162-8777/ac741a
RT Journal T1 <Title>Study on Negative Bias Temperature Instability Induced Degradation of P-Type FinFETs by Distinguishing Fin Top and Fin Sidewalls</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1149_2162-8777_ac741a&Exemplar=1&LAN=DE A1 Yeh, Wen-Kuan A1 Yang, Li-Quan A1 Shen, Cheng-Hao A1 Kong, Jhih-Hao A1 Tseng, Po-Yang A1 Yang, Yi-Lin PB The Electrochemical Society YR 2022 SN 2162-8769 SN 2162-8777 JF ECS Journal of Solid State Science and Technology VO 11 IS 6 SP 065005 LK http://dx.doi.org/https://doi.org/10.1149/2162-8777/ac741a DO https://doi.org/10.1149/2162-8777/ac741a SF ELIB - SuUB Bremen
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