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1 Ergebnisse
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Reduction of Corner Effect in ZG-ES-TFET for Improved Elect..:
Ashok, Tammisetti
;
Pandey, Chandan Kumar
ECS Journal of Solid State Science and Technology. 12 (2023) 7 - p. 071005 , 2023
Link:
https://doi.org/10.1149/2162-8777/ace656
RT Journal T1 <Title>Reduction of Corner Effect in ZG-ES-TFET for Improved Electrical Performance and its Reliability Analysis in the Presence of Traps</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1149_2162-8777_ace656&Exemplar=1&LAN=DE A1 Ashok, Tammisetti A1 Pandey, Chandan Kumar PB The Electrochemical Society YR 2023 SN 2162-8769 SN 2162-8777 JF ECS Journal of Solid State Science and Technology VO 12 IS 7 SP 071005 LK http://dx.doi.org/https://doi.org/10.1149/2162-8777/ace656 DO https://doi.org/10.1149/2162-8777/ace656 SF ELIB - SuUB Bremen
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