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1 Ergebnisse
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Effect of Local Substrate Removal and Backside Al Heat Diss..:
Lin, Yuan
;
Huang, Hsuan-Yao
;
Weng, You-Chen
...
ECS Journal of Solid State Science and Technology. 12 (2023) 9 - p. 095005 , 2023
Link:
https://doi.org/10.1149/2162-8777/acfbb4
RT Journal T1 <Title>Effect of Local Substrate Removal and Backside Al Heat Dissipation Layer on GaN-on-Si Device RF Performance</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1149_2162-8777_acfbb4&Exemplar=1&LAN=DE A1 Lin, Yuan A1 Huang, Hsuan-Yao A1 Weng, You-Chen A1 Kuo, Hao-Chung A1 Dee, Chang Fu A1 Lin, Chun-Hsiung A1 Chang, Edward Yi PB The Electrochemical Society YR 2023 SN 2162-8769 SN 2162-8777 JF ECS Journal of Solid State Science and Technology VO 12 IS 9 SP 095005 LK http://dx.doi.org/https://doi.org/10.1149/2162-8777/acfbb4 DO https://doi.org/10.1149/2162-8777/acfbb4 SF ELIB - SuUB Bremen
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