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1 Ergebnisse
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Exploring Performance and Reliability Behavior of Nanosheet..:
Ma, William Cheng-Yu
;
Su, Chun-Jung
;
Kao, Kuo-Hsing
...
ECS Journal of Solid State Science and Technology. 12 (2023) 10 - p. 105004 , 2023
Link:
https://doi.org/10.1149/2162-8777/ad017b
RT Journal T1 <Title>Exploring Performance and Reliability Behavior of Nanosheet Channel Thin-Film Transistors under Independent Dual Gate Bias Operation</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1149_2162-8777_ad017b&Exemplar=1&LAN=DE A1 Ma, William Cheng-Yu A1 Su, Chun-Jung A1 Kao, Kuo-Hsing A1 Chen, Yan-Qing A1 Guo, Jing-Qiang A1 Wu, Cheng-Jun A1 Wu, Po-Ying A1 Hung, Jia-Yuan PB The Electrochemical Society YR 2023 SN 2162-8769 SN 2162-8777 JF ECS Journal of Solid State Science and Technology VO 12 IS 10 SP 105004 LK http://dx.doi.org/https://doi.org/10.1149/2162-8777/ad017b DO https://doi.org/10.1149/2162-8777/ad017b SF ELIB - SuUB Bremen
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