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Numerical Simulation of Hetero Dielectric Trench Gate JAM G..:
Yadav, Shivani
;
Rewari, Sonam
ECS Journal of Solid State Science and Technology. 12 (2023) 12 - p. 127008 , 2023
Link:
https://doi.org/10.1149/2162-8777/ad161f
RT Journal T1 <Title>Numerical Simulation of Hetero Dielectric Trench Gate JAM Gate-All-Around FET (HDTG-JAM-GAAFET) for Label Free Biosensing Applications</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1149_2162-8777_ad161f&Exemplar=1&LAN=DE A1 Yadav, Shivani A1 Rewari, Sonam PB The Electrochemical Society YR 2023 SN 2162-8769 SN 2162-8777 JF ECS Journal of Solid State Science and Technology VO 12 IS 12 SP 127008 LK http://dx.doi.org/https://doi.org/10.1149/2162-8777/ad161f DO https://doi.org/10.1149/2162-8777/ad161f SF ELIB - SuUB Bremen
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