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1 Ergebnisse
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Localized Stress Effects on the Single Event Effects Sensit..:
Stepanoff, Sergei P.
;
Khachatrian, Ani
;
Haque, Aman
...
ECS Journal of Solid State Science and Technology. 13 (2024) 6 - p. 065004 , 2024
Link:
https://doi.org/10.1149/2162-8777/ad522a
RT Journal T1 <Title>Localized Stress Effects on the Single Event Effects Sensitivity of Microelectronics</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1149_2162-8777_ad522a&Exemplar=1&LAN=DE A1 Stepanoff, Sergei P. A1 Khachatrian, Ani A1 Haque, Aman A1 Ren, Fan A1 Pearton, Stephen A1 Wolfe, Douglas E. PB The Electrochemical Society YR 2024 SN 2162-8769 SN 2162-8777 JF ECS Journal of Solid State Science and Technology VO 13 IS 6 SP 065004 LK http://dx.doi.org/https://doi.org/10.1149/2162-8777/ad522a DO https://doi.org/10.1149/2162-8777/ad522a SF ELIB - SuUB Bremen
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