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1 Ergebnisse
1
ADC Production Test Technique Using Low‐Resolution Arbitrar..:
Kerzérho, V.
;
Cauvet, P.
;
Bernard, S.
...
VLSI Design. 2008 (2008) 1 - p. , 2008
Link:
https://doi.org/10.1155/2008/482159
RT Journal T1
ADC Production Test Technique Using Low‐Resolution Arbitrary Waveform Generator
UL https://suche.suub.uni-bremen.de/peid=cr-10.1155_2008_482159&Exemplar=1&LAN=DE A1 Kerzérho, V. A1 Cauvet, P. A1 Bernard, S. A1 Azaïs, F. A1 Renovell, M. A1 Comte, M. A1 Chakib, O. A1 Machado da Silva, José PB Wiley YR 2008 SN 1065-514X SN 1563-5171 JF VLSI Design VO 2008 IS 1 LK http://dx.doi.org/https://doi.org/10.1155/2008/482159 DO https://doi.org/10.1155/2008/482159 SF ELIB - SuUB Bremen
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