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Enhancing Structural Crack Detection through a Multiscale M..:
Ham, Ji-Wan
;
Jeong, Siheon
;
Kim, Min-Gwan
...
International Journal of Intelligent Systems. 2023 (2023) - p. 1-22 , 2023
Link:
https://doi.org/10.1155/2023/8212790
RT Journal T1 <Title>Enhancing Structural Crack Detection through a Multiscale Multilevel Mask Deep Convolutional Neural Network and Line Similarity Index</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1155_2023_8212790&Exemplar=1&LAN=DE A1 Ham, Ji-Wan A1 Jeong, Siheon A1 Kim, Min-Gwan A1 Park, Joon-Young A1 Oh, Ki-Yong A1 Tan, Yu-An PB Hindawi Limited YR 2023 SN 1098-111X SN 0884-8173 JF International Journal of Intelligent Systems VO 2023 SP 1 OP 22 LK http://dx.doi.org/https://doi.org/10.1155/2023/8212790 DO https://doi.org/10.1155/2023/8212790 SF ELIB - SuUB Bremen
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