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DiaMe: IoMT deep predictive model based on threshold aware ..:
Abbas, Safia
;
Mahmoud, Abeer M.
International Journal of Electrical and Computer Engineering (IJECE). 11 (2021) 5 - p. 4250 , 2021
Link:
https://doi.org/10.11591/ijece.v11i5.pp4250-4262
RT Journal T1 <Title>DiaMe: IoMT deep predictive model based on threshold aware region growing technique</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.11591_ijece.v11i5.pp4250-4262&Exemplar=1&LAN=DE A1 Abbas, Safia A1 Mahmoud, Abeer M. PB Institute of Advanced Engineering and Science YR 2021 SN 2722-2578 SN 2088-8708 JF International Journal of Electrical and Computer Engineering (IJECE) VO 11 IS 5 SP 4250 LK http://dx.doi.org/https://doi.org/10.11591/ijece.v11i5.pp4250-4262 DO https://doi.org/10.11591/ijece.v11i5.pp4250-4262 SF ELIB - SuUB Bremen
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