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Neutron reflectivity investigation of bis-amino silane film:
Pan, Guirong
;
Yim, Hyun
;
Kent, Michael S.
..
Journal of Adhesion Science and Technology. 17 (2003) 16 - p. 2175-2189 , 2003
Link:
https://doi.org/10.1163/156856103772150779
RT Journal T1 <Title>Neutron reflectivity investigation of bis-amino silane films</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1163_156856103772150779&Exemplar=1&LAN=DE A1 Pan, Guirong A1 Yim, Hyun A1 Kent, Michael S. A1 Majewski, Jaroslaw A1 Schaefer, Dale W. PB Informa UK Limited YR 2003 SN 0169-4243 SN 1568-5616 JF Journal of Adhesion Science and Technology VO 17 IS 16 SP 2175 OP 2189 LK http://dx.doi.org/https://doi.org/10.1163/156856103772150779 DO https://doi.org/10.1163/156856103772150779 SF ELIB - SuUB Bremen
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