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1 Ergebnisse
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Risk for Work-Related Fatigue Among the Employees on Semico..:
Lin, Yu-Cheng
;
Chen, Yen-Cheng
;
Hsieh, Hui-I
.
Asia Pacific Journal of Public Health. 27 (2013) 2 - p. NP1805-NP1818 , 2013
Link:
https://doi.org/10.1177/1010539513490788
RT Journal T1 <Title>Risk for Work-Related Fatigue Among the Employees on Semiconductor Manufacturing Lines</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1177_1010539513490788&Exemplar=1&LAN=DE A1 Lin, Yu-Cheng A1 Chen, Yen-Cheng A1 Hsieh, Hui-I A1 Chen, Pau-Chung PB SAGE Publications YR 2013 SN 1010-5395 SN 1941-2479 JF Asia Pacific Journal of Public Health VO 27 IS 2 SP NP1805 OP NP1818 LK http://dx.doi.org/https://doi.org/10.1177/1010539513490788 DO https://doi.org/10.1177/1010539513490788 SF ELIB - SuUB Bremen
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