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1 Ergebnisse
1
Reliability:
, In:
Silicon-Germanium Heterojunction Bipolar Transistors for Mm-wave Systems Technology, Modeling and Circuit Applications
,
d'Alessandro, V.
;
Maneux, C.
;
Fischer, G. G.
... - p. 185-234 , 2022
Link:
https://doi.org/10.1201/9781003339519-6
RT T1 <cTitle>Silicon-Germanium Heterojunction Bipolar Transistors for Mm-wave Systems Technology, Modeling and Circuit Applications</cTitle>: T1 <Title>Reliability</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1201_9781003339519-6&Exemplar=1&LAN=DE A1 d'Alessandro, V. A1 Maneux, C. A1 Fischer, G. G. A1 Aufinger, K. A1 Magnani, A. A1 Russo, S. A1 Rinaldi, N. PB River Publishers YR 2022 SP 185 OP 234 LK http://dx.doi.org/https://doi.org/10.1201/9781003339519-6 DO https://doi.org/10.1201/9781003339519-6 SF ELIB - SuUB Bremen
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