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1 Ergebnisse
1
Influence of Random InGaN Alloy Fluctuations on GaN-Based L..:
, In:
Handbook of Optoelectronic Device Modeling and Simulation
,
Wu, Chen-Kuo
;
Yang, Tsung-Jui
;
Wu, Yuh-Renn
- p. 559-588 , 2017
Link:
https://doi.org/10.1201/9781315152301-18
RT T1 <cTitle>Handbook of Optoelectronic Device Modeling and Simulation</cTitle>: T1 <Title>Influence of Random InGaN Alloy Fluctuations on GaN-Based Light-Emitting Diodes</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1201_9781315152301-18&Exemplar=1&LAN=DE A1 Wu, Chen-Kuo A1 Yang, Tsung-Jui A1 Wu, Yuh-Renn PB CRC Press YR 2017 SP 559 OP 588 LK http://dx.doi.org/https://doi.org/10.1201/9781315152301-18 DO https://doi.org/10.1201/9781315152301-18 SF ELIB - SuUB Bremen
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