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1 Ergebnisse
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Analysis of junction temperature and modification of lumino..:
Ke, Hong-Liang
;
Jing, Lei
;
Hao, Jian
...
Applied Optics. 55 (2016) 22 - p. 5909 , 2016
Link:
https://doi.org/10.1364/ao.55.005909
RT Journal T1
Analysis of junction temperature and modification of luminous flux degradation for white LEDs in a thermal accelerated reliability test
UL https://suche.suub.uni-bremen.de/peid=cr-10.1364_ao.55.005909&Exemplar=1&LAN=DE A1 Ke, Hong-Liang A1 Jing, Lei A1 Hao, Jian A1 Gao, Qun A1 Wang, Yao A1 Wang, Xiao-xun A1 Sun, Qiang A1 Xu, Zhi-Jun PB Optica Publishing Group YR 2016 SN 0003-6935 SN 1539-4522 JF Applied Optics VO 55 IS 22 SP 5909 LK http://dx.doi.org/https://doi.org/10.1364/ao.55.005909 DO https://doi.org/10.1364/ao.55.005909 SF ELIB - SuUB Bremen
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