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1 Ergebnisse
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Depth profiling analysis of CuIn_1-xGa_xSe_2 absorber layer..:
Kim, Chan Kyu
;
Lee, Seok Hee
;
In, Jung Hwan
..
Optics Express. 21 (2013) S6 - p. A1018 , 2013
Link:
https://doi.org/10.1364/oe.21.0a1018
RT Journal T1
Depth profiling analysis of CuIn_1-xGa_xSe_2 absorber layer by laser induced breakdown spectroscopy in atmospheric conditions
UL https://suche.suub.uni-bremen.de/peid=cr-10.1364_oe.21.0a1018&Exemplar=1&LAN=DE A1 Kim, Chan Kyu A1 Lee, Seok Hee A1 In, Jung Hwan A1 Lee, Hak Jae A1 Jeong, Sungho PB Optica Publishing Group YR 2013 SN 1094-4087 JF Optics Express VO 21 IS S6 SP A1018 LK http://dx.doi.org/https://doi.org/10.1364/oe.21.0a1018 DO https://doi.org/10.1364/oe.21.0a1018 SF ELIB - SuUB Bremen
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