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1 Ergebnisse
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Wavefront metrology for coherent hard X-rays by scanning a ..:
Skjønsfjell, Eirik Torbjørn Bakken
;
Chushkin, Yuriy
;
Zontone, Federico
...
Optics Express. 24 (2016) 10 - p. 10710 , 2016
Link:
https://doi.org/10.1364/oe.24.010710
RT Journal T1
Wavefront metrology for coherent hard X-rays by scanning a microsphere
UL https://suche.suub.uni-bremen.de/peid=cr-10.1364_oe.24.010710&Exemplar=1&LAN=DE A1 Skjønsfjell, Eirik Torbjørn Bakken A1 Chushkin, Yuriy A1 Zontone, Federico A1 Patil, Nilesh A1 Gibaud, Alain A1 Breiby, Dag W. PB Optica Publishing Group YR 2016 SN 1094-4087 JF Optics Express VO 24 IS 10 SP 10710 LK http://dx.doi.org/https://doi.org/10.1364/oe.24.010710 DO https://doi.org/10.1364/oe.24.010710 SF ELIB - SuUB Bremen
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