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1 Ergebnisse
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Spectroscopic ellipsometry of inhomogeneous thin films exhi..:
Ohlídal, Ivan
;
Vohánka, Jiří
;
Buršíková, Vilma
..
Optics Express. 28 (2019) 1 - p. 160 , 2019
Link:
https://doi.org/10.1364/oe.28.000160
RT Journal T1
Spectroscopic ellipsometry of inhomogeneous thin films exhibiting thickness non-uniformity and transition layers
UL https://suche.suub.uni-bremen.de/peid=cr-10.1364_oe.28.000160&Exemplar=1&LAN=DE A1 Ohlídal, Ivan A1 Vohánka, Jiří A1 Buršíková, Vilma A1 Franta, Daniel A1 Čermák, Martin PB Optica Publishing Group YR 2019 SN 1094-4087 JF Optics Express VO 28 IS 1 SP 160 LK http://dx.doi.org/https://doi.org/10.1364/oe.28.000160 DO https://doi.org/10.1364/oe.28.000160 SF ELIB - SuUB Bremen
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