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1 Ergebnisse
1
X-ray focusing below 3 nm with aberration-corrected multila..:
Dresselhaus, J. Lukas
;
Zakharova, Margarita
;
Ivanov, Nikolay
...
Optics Express. , 2024
Link:
https://doi.org/10.1364/oe.518964
RT Journal T1
X-ray focusing below 3 nm with aberration-corrected multilayer Laue lenses
UL https://suche.suub.uni-bremen.de/peid=cr-10.1364_oe.518964&Exemplar=1&LAN=DE A1 Dresselhaus, J. Lukas A1 Zakharova, Margarita A1 Ivanov, Nikolay A1 Fleckenstein, Holger A1 Prasciolu, Mauro A1 Yefanov, Oleksandr A1 Li, Chufeng A1 Zhang, Wenhui A1 Middendorf, Philipp A1 Ergov, Dmitry A1 de Gennaro Aquino, Ivan A1 Chapman, Henry A1 Bajt, Saša PB Optica Publishing Group YR 2024 SN 1094-4087 JF Optics Express LK http://dx.doi.org/https://doi.org/10.1364/oe.518964 DO https://doi.org/10.1364/oe.518964 SF ELIB - SuUB Bremen
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